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 Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
GENERAL DESCRIPTION
N-channel enhancement mode logic level field-effect power transistor in a plastic envelope suitable for surface mounting. The device features very low on-state resistance and has integral zener diodes giving ESD protection. It is intended for use in automotive and general purpose switching applications.
BUK98150-55
QUICK REFERENCE DATA
SYMBOL VDS ID Ptot Tj RDS(ON) PARAMETER Drain-source voltage Drain current Total power dissipation Junction temperature Drain-source on-state resistance VGS = 5 V MAX. 55 5.5 1.8 150 150 UNIT V A W C m
PINNING - SOT223
PIN 1 2 3 4 gate drain source drain (tab) DESCRIPTION
PIN CONFIGURATION
4
SYMBOL
d
g s
1
2
3
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134) SYMBOL VDS VDGR VGS ID ID ID IDM Ptot Ptot Tstg, Tj PARAMETER Drain-source voltage Drain-gate voltage Gate-source voltage Drain current (DC) Drain current (DC) Drain current (DC) Drain current (pulse peak value) Total power dissipation Total power dissipation Storage & operating temperature CONDITIONS RGS = 20 k Tsp = 25 C On PCB in Fig.19 Tamb = 25 C On PCB in Fig.19 Tamb = 100 C Tsp = 25 C Tsp = 25 C On PCB in Fig.19 Tamb = 25 C MIN. - 55 MAX. 55 55 10 5.5 2.6 1.6 30 8.3 1.8 150 UNIT V V V A A A A W W C
ESD LIMITING VALUE
SYMBOL VC PARAMETER Electrostatic discharge capacitor voltage CONDITIONS Human body model (100 pF, 1.5 k) MIN. MAX. 2 UNIT kV
February 1998
1
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
THERMAL RESISTANCES
SYMBOL Rth j-sp Rth j-amb PARAMETER From junction to solder point From junction to ambient CONDITIONS Mounted on any PCB Mounted on PCB of Fig.18 TYP. 12 -
BUK98150-55
MAX. 15 70
UNIT K/W K/W
STATIC CHARACTERISTICS
Tj= 25C unless otherwise specified SYMBOL V(BR)DSS VGS(TO) IDSS IGSS V(BR)GSS RDS(ON) PARAMETER Drain-source breakdown voltage Gate threshold voltage Zero gate voltage drain current Gate source leakage current CONDITIONS VGS = 0 V; ID = 0.25 mA Tj = -55C VDS = VGS; ID = 1 mA Tj = 150C Tj = -55C VDS = 55 V; VGS = 0 V; VGS = 5 V Tj = 150C Tj = 150C Tj = 150C MIN. 55 50 1.0 0.6 10 TYP. 1.5 0.05 0.02 120 MAX. 2.0 2.3 10 100 1 5 150 277 UNIT V V V V V A A A A V m m
Gate source breakdown voltage VGS = 1 mA Drain-source on-state VGS = 5 V; ID = 5 A resistance
DYNAMIC CHARACTERISTICS
Tmb = 25C unless otherwise specified SYMBOL gfs Ciss Coss Crss td on tr td off tf PARAMETER Forward transconductance Input capacitance Output capacitance Feedback capacitance Turn-on delay time Turn-on rise time Turn-off delay time Turn-off fall time CONDITIONS VDS = 25 V; ID = 5 A; Tj = 25C VGS = 0 V; VDS = 25 V; f = 1 MHz MIN. 3 TYP. 5 250 65 35 11 38 25 20 MAX. 330 80 50 17 60 38 38 UNIT S pF pF pF ns ns ns ns
VDD = 30 V; ID = 5 A; VGS = 5 V; RG = 10 ; Tj = 25C
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = -55 to 175C unless otherwise specified SYMBOL IDR IDRM VSD trr Qrr PARAMETER Continuous reverse drain current Pulsed reverse drain current Diode forward voltage Reverse recovery time Reverse recovery charge CONDITIONS Tsp = 25C Tsp = 25C IF = 2 A; VGS = 0 V IF = 2 A; -dIF/dt = 100 A/s; VGS = -10 V; VR = 30 V MIN. TYP. 0.85 43 0.16 MAX. 5.5 30 1.1 UNIT A A V ns C
February 1998
2
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
AVALANCHE LIMITING VALUE
SYMBOL WDSS PARAMETER Drain-source non-repetitive unclamped inductive turn-off energy CONDITIONS ID = 1.9 A; VDD 25 V; VGS = 5 V; RGS = 50 ; Tsp = 25 C MIN. -
BUK98150-55
TYP. -
MAX. 15
UNIT mJ
120 110 100 90 80 70 60 50 40 30 20 10 0
PD%
Normalised Power Derating
100 ID/A tp = RDS(ON) = VDS/ID 10 1 us 10 us
BUKX8150-55
100 us 1 DC 1 ms 10 ms 100 ms
0
20
40
60
80 100 Tmb / C
120
140
0.1
1
10 VDS/V
55
Fig.1. Normalised power dissipation. PD% = 100PD/PD 25 C = f(Tsp)
Fig.3. Safe operating area. Tsp = 25 C ID & IDM = f(VDS); IDM single pulse; parameter tp
120 110 100 90 80 70 60 50 40 30 20 10 0
ID%
Normalised Current Derating
1E+02 3E+01 1E+01 3E+00 1E+00 3E-01 1E-01 3E-02
Zth / (K/W)
BUKX8150-55
0.5 0.2 0.1 0.05 0.02 0 T P D tp D= tp T t
0
20
40
60
80 Tmb / C
100
120
140
1E-02 1E-07
1E-05
1E-03 t/s
1E-01
1E+01
Fig.2. Normalised continuous drain current. ID% = 100ID/ID 25 C = f(Tsp); conditions: VGS 5 V
Fig.4. Transient thermal impedance. Zth j-sp = f(t); parameter D = tp/T
February 1998
3
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
BUK98150-55
10 10 ID/A 8 5
7
4 3.8
VGS/V = 3.6
gfs/S 6
3.4 6
5
3.2 3.0 2.8
4
4
2
3
2.6 2.4 2.2 0 2 4 6 8 10
2
0
1
2
3
4
5 ID/A
6
7
8
9
10
Fig.5. Typical output characteristics, Tj = 25 C. ID = f(VDS); parameter VGS
400 RDS(ON)mOhm 350 300 3.2 250 200 150 100 50 3.4 3.6 4 5
Fig.8. Typical transconductance, Tj = 25 C. gfs = f(ID); conditions: VDS = 25 V
3
2.5
a
BUK98XX-55
Rds(on) normalised to 25degC
2
1.5
1
1
2
3
4
5
ID/A
6
7
8
9
10
11
0.5 -100
-50
0
50 Tmb / degC
100
150
200
Fig.6. Typical on-state resistance, Tj = 25 C. RDS(ON) = f(ID); parameter VGS
10 ID/A 8
Fig.9. Normalised drain-source on-state resistance. a = RDS(ON)/RDS(ON)25 C = f(Tj); ID = 5 A; VGS = 5 V
VGS(TO) / V max. 2 typ. BUK98xx-55
2.5
6
1.5 min.
4
1
2 Tj/C = 150 0 25
0.5
0
1
2
VGS/V
3
4
5
0 -100
-50
0
50 Tj / C
100
150
200
Fig.7. Typical transfer characteristics. ID = f(VGS) ; conditions: VDS = 25 V; parameter Tj
Fig.10. Gate threshold voltage. VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS
February 1998
4
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
BUK98150-55
1E-01
Sub-Threshold Conduction
10 IF/A 8
1E-02 2% typ 98%
6 Tj/C = 4 150 25
1E-03
1E-04
2
1E-05
0
1E-05
0
0.2
0.4
0
0.5
1
1.5
2
2.5
3
0.6 0.8 VSDS/V
1
1.2
1.4
Fig.11. Sub-threshold drain current. ID = f(VGS); conditions: Tj = 25 C; VDS = VGS
600
Fig.14. Typical reverse diode current. IF = f(VSDS); conditions: VGS = 0 V; parameter Tj
WDSS%
120 110 100 90 80 70 60 50
Ciss
500
400 pF 300
200
40 30 20 10
100 Coss Crss 0.1 1 VDS/V 10 100
0 20 40 60 80 100 Tmb / C 120 140
0 0.01
Fig.12. Typical capacitances, Ciss, Coss, Crss. C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
6 VGS/V 5
Fig.15. Normalised avalanche energy rating. WDSS% = f(Tsp); conditions: ID = 1.9 A
+
L
VDS = 14V VDS = 44V
VDD
4
VDS VGS 0 RGS T.U.T. R 01 shunt
3
-ID/100
2
1
0
0
1
2
QG/nC
3
4
5
Fig.13. Typical turn-on gate-charge characteristics. VGS = f(QG); conditions: ID = 5 A; parameter VDS
Fig.16. Avalanche energy test circuit. 2 WDSS = 0.5 LID BVDSS /(BVDSS - VDD )
February 1998
5
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
BUK98150-55
+
RD VDS VGS 0 RG T.U.T.
VDD
-
Fig.17. Switching test circuit.
February 1998
6
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
PRINTED CIRCUIT BOARD
BUK98150-55
Dimensions in mm.
36
18
60 9 4.6 4.5
10
7 15 50
Fig.18. PCB for thermal resistance and power rating for SOT223. PCB: FR4 epoxy glass (1.6 mm thick), copper laminate (35 m thick).
February 1998
7
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
MECHANICAL DATA
Dimensions in mm Net Mass: 0.11 g
0.32 0.24 6.7 6.3 3.1 2.9 B
BUK98150-55
0.2
M
A
4
A
0.10 0.02
3.7 3.3 13
7.3 6.7
16 max
1
10 max 1.8 max 1.05 0.85 4.6 2.3
2
0.80 0.60
3
0.1 M (4x) B
Fig.19. SOT223 surface mounting package.
Notes 1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent damage to MOS gate oxide. 2. Refer to surface mounting instructions for SOT223 envelope. 3. Epoxy meets UL94 V0 at 1/8".
February 1998
8
Rev 1.000
Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
DEFINITIONS
Data sheet status Objective specification Product specification Limiting values
BUK98150-55
This data sheet contains target or goal specifications for product development. This data sheet contains final product specifications.
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Where application information is given, it is advisory and does not form part of the specification. (c) Philips Electronics N.V. 1998 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these products can be reasonably expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
February 1998
9
Rev 1.000


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